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ST70135 데이터 시트보기 (PDF) - STMicroelectronics

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ST70135
ST-Microelectronics
STMicroelectronics ST-Microelectronics
ST70135 Datasheet PDF : 29 Pages
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ST70135A
Figure 1 : Block Diagram
TEST SIGNALS
CLOCK
AFE
INTERFACE
AFE
CONTROL
TEST MODULE
DATA SYMBOL TIMING UNIT
VCXO
DSP
FRONT-END
FFT/IFFT
ROTOR
TRELLIS
CODING
MAPPER/
DEMAPPER
GENERIC
TC
REED/
SOLOMON
INTERFACE
MODULE
AFE CONTROL
INTERFACE
CONTROLLER
INTERFACE
ATM
SPECIFIC TC
STM
UTOPIA
CONTROLLER
GENERAL
BUS
PURPOSE I/Os
TRANSIENT ENERGY CAPABILITIES
ESD
ESD (Electronic Discharged) tests have been
performed for the Human Body Model (HBM) and
for the Charged Device Model (CDM). The pins of
ABSOLUTE MAXIMUM RATINGS
the device are to be able to withstand minimum
2000V for the HBM and minimum 250V for CDM.
Latch-up
The maximum sink or source current from any pin
is limited to 200mA to prevent latch-up.
Symbol
VDD
Ptot
Tamb
Parameter
Supply Voltage
Total Power Dissipation
Ambient Temperature 1m/s airflow
Minimum Typical Maximum Unit
3.0
3.3
3.6
V
900
1400
mW
0
70
°C
2/29

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