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STD8NM50N(2018) 데이터 시트보기 (PDF) - STMicroelectronics

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STD8NM50N Datasheet PDF : 21 Pages
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STD8NM50N, STP8NM50N
Test circuits
3
Test circuits
Figure 14. Test circuit for resistive load switching times
VGS
pulse width
VD
RG
RL
2200
3.3
+ μF
μF
VDD
D.U.T.
AM01468v1
Figure 16. Test circuit for inductive load switching and
diode recovery times
Figure 15. Test circuit for gate charge behavior
VGS
pulse width
+
2200
μF
1 kΩ
12 V
47 kΩ
100 nF
VDD
1 kΩ
IG= CONST
2.7 kΩ
47 kΩ
100 Ω
D.U.T.
VG
AM01469v1
Figure 17. Unclamped inductive load test circuit
A
D
AA
G
D.U.T.
fast
diode
100 µH
S
B
25 Ω
BB
D
3.3
µF
1000
+ µF
VDD
G
D.U.T.
+ RG
S
_
AM01470v1
Figure 18. Unclamped inductive waveform
V(BR)DSS
VD
VDD
IDM
ID
VDD
AM01472v1
L
VD
2200
+ µF
3.3
µF
VDD
ID
Vi
pulse width
D.U.T.
AM01471v1
Figure 19. Switching time waveform
ton
td(on)
tr
toff
td(off)
tf
90%
90%
0
10%
VDS
10%
VGS
90%
0
10%
AM01473v1
DS6808 - Rev 7
page 8/21

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