CXD1186CR 데이터 시트보기 (PDF) - Sony Semiconductor
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CXD1186CR Datasheet PDF : 46 Pages
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CXD1186CQ/CR
AC characteristics
1. CPU interface
(1) Read
(Ta=–20 to +75 °C, VDD=5 V±10 %, Output Load=50 pF, f≤ 24.576 MHz)
A0 to 3
XCS
XRD
DB0 to 7
tSAR
tRRL
tDRD
tHRA
tFRD
Item
Address setup time (vs. XCS & XRD ↓)
Address hold time (vs. XCS & XRD ↑)
Data delay time (vs. XCS & XRD ↓)
Data float time (vs. XCS & XRD ↑)
Low level XRD pulse width
Symbol Min.
Typ.
Max.
Unit
tSAR
30
n
tHRA
20
n
tDRD
60
n
tFRD
0
10
n
tRRL
100
n
(2) Write
A0 to 3
XCS
XWR
DB0 to 7
tSAW
tWWL
tHWA
tSDW tHWD
Item
Symbol Min.
Typ.
Max.
Unit
Address setup time (vs. XCS & XWR ↓)
tSAW
30
n
Address hold time (vs. XCS & XWR ↑)
tHWA
20
n
Data setup time (vs. XCS & XWR ↑)
tSDW
40
n
Data hold time (vs. XCS & XWR ↑)
tHWD
10
n
Low level XWR pulse width
tWWL
50
n
Where & in the chart indicates logical multiplication.
—7—
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