TEST CIRCUITS AND METHODS
VCC
SW6
SW3 10 µF
TK15323
33 µF
SW9
SW7
SW8
10 µF
SW4
50 kΩ
1 kHz 10 kHz
1 Vrms 1 Vrms
or ~
~
2 Vrms
10 kΩ
SW5
VCC / 2
50 kΩ
SW2
SW1
L
H
V~
V_
THD
1: The above condition represents 1ch.
2: The above conditions distortion rate of 1-Ach and dynamic range measurement.
3: SW5 is for residual noise measurement.
4: SW8 is for cross talk (ISO or SEP) measurement.
SUPPLY CURRENT (FIGURE 1)
VCC
A
This current is a consumption current with a nonloading
condition.
1) Bias supply to Pins 2,4,9,11. (This condition is the same
with other measurements, omitted from the next for
simplicity)
2) Measure the inflow current to Pin 1 from VCC. This current is
the supply current.
50 K
50 K
50 K
50 K
VCC / 2
Figure 1
June 1999 TOKO, Inc.
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