UPD70108C 데이터 시트보기 (PDF) - NEC => Renesas Technology
부품명
상세내역
제조사
UPD70108C Datasheet PDF : 12 Pages
| |||
NEC Electronics Inc.
Roseville Manufacturing
Table 3. HTB Life Test Summary and Failure Rate Predictions
This table summarizes the reliability test results of processes extensively used by most NEC microprocessor products. The
failure rate predictions are based on both 125°C and 150°C high-temperature bias life test results. Failure rate predictions
are shown for the current period of available data and for past periods of cumulative data.
µPD7720AC
(28-pin DIP)
Process Type
Jan 88–Dec 98
(cumulative)
Process Period
NMOS-4
Total
Jan 88– Mar 99
(cumulative)
µPD77C20AC Jul 90– Mar 99
(28-pin DIP) (cumulative)
µPD77C25C
(28-pin DIP)
Jul 90– Mar 99
(cumulative)
µPD70108C
(40-pin DIP)
µPD7503A
(64-pin QFP)
µPD75304
(80-pin QFP)
µPD75306
(80-pin QFP)
µPD75308
(80-pin QFP)
µPD75312
(80-pin QFP)
Jan 90– Mar 99
(cumulative)
Jan 97– Mar 99
(cumulative)
Apr 92– Mar 99
(cumulative)
Apr 92– Mar 99
(cumulative)
Jan 90– Mar 99
(cumulative)
Jul 94– Mar 99
(cumulative)
µPD75316
(80-pin QFP)
Jul 94– Mar 99
(cumulative)
µPD17010
(80-pin QFP)
Oct 94– Mar 99
(cumulative)
µPD78C10
(80-pin QFP)
Jan 92– Mar 99
(cumulative)
Singapore Assembly
µPD75216
(80-pin QFP)
Jan 92– Mar 99
(cumulative)
Singapore Assembly
µPD75308
Jan 92– Mar 99
(80-pin QFP) (cumulative)
Singapore Assembly
CMOS-4
Total
Jan 89– Mar 99
(cumulative)
µPD70208
Jan 92– Mar 99
(68-pin PLCC) (cumulative)
∝PD70216
Apr 93– Mar 99
(68-pin PLCC) (cumulative)
µPD70320
Jul 91– Mar 99
(84-pin PLCC) (cumulative)
µPD70325
Jan 92– Mar 99
(84-pin PLCC) (cumulative)
(125°C)
Ambient
Temp.
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
(125°C)
448
520,000
Number
of
Devices
448
Accum,.
Device
Hours
520,000
432
432,000
96
96,000
24
24,000
168
168,000
384
384,000
120
120,000
360
360,000
312
311,168
552
552,000
72
72,000
24
24,000
144
144,000
120
120,000
2808
748
936
508
644
2,812,168
736,000
936,000
508,000
644,000
0
No. of
Failures
0
0
0
0
0
0
0
0
1
0
0
0
0
0
1
0
0
0
1
17.9
Accel.
Factor
(Note 1)
17.9
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
32.6
11.3
11.3
11.3
11.3
9.3 x 106
Equiv.
Device
Hours
9.3 x 106
1.41 x 107
3.13 x 106
7.82 x 105
5.48 x 106
1.25 x 107
2.35 x 106
8.61 x 106
9.39 x 106
1.80 x 107
2.35 x 106
7.82 x 105
Failure Rate, 55°C
and 60% Confidence
Level (Note 2)
0.0098 %/1000
= 98.0 FIT
4.69 x 106
3.91 x 106
9.17 x107
805. x 106
1.06 x 107
3.30 x 106
5.65 x 106
0.0022%/1000
= 22FIT
6
Share Link: 