STF6N60M2, STP6N60M2, STU6N60M2
3
Test circuits
Test circuits
Figure 17. Switching times test circuit for
resistive load
Figure 18. Gate charge test circuit
VDD
VD
VGS
RG
RL
2200
μF
D.U.T.
3.3
μF VDD
12V
Vi=20V=VGMAX
2200
μF
IG=CONST
2.7kΩ
47kΩ
1kΩ
100nF
100Ω
D.U.T.
VG
PW
47kΩ
PW
AM01468v1
1kΩ
AM01469v1
Figure 19. Test circuit for inductive load
switching and diode recovery times
Figure 20. Unclamped inductive load test circuit
G
25 Ω
A
D
D.U.T.
S
B
AA
FAST
DIODE
L=100μH
B
3.3
B
μF
D
G
RG
S
1000
μF
VDD
Vi
L
VD
2200
3.3
μF
μF
VDD
ID
D.U.T.
AM01470v1
Figure 21. Unclamped inductive waveform
9%5'66
9'
Pw
AM01471v1
Figure 22. Switching time waveform
ton
toff
tdon
tr
tdoff tf
9''
,'0
,'
0
9''
90%
10% VDS
90%
VGS
90%
10%
$0Y
0
10%
AM01473v1
DocID024771 Rev 2
9/18
18