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CR0201-FW-1002GLF 데이터 시트보기 (PDF) - Unspecified

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CR0201-FW-1002GLF
ETC
Unspecified ETC
CR0201-FW-1002GLF Datasheet PDF : 3 Pages
1 2 3
CR0201 - Chip Resistor
Performance Characteristics
Test
Thermal Shock
Short Time Overload
Resistance to Solder Heat
Resistance to Dry Heat
Load Life
Load Life with Humidity
Solderability
Bending
Dielectric Withstanding
Voltage
Insulation Resistance
Procedure
-55 ℃ for 30 minutes, +155 ℃ for 30 minutes, 5 cycles
2.5 X rated voltage for 5 seconds
270 ±5 ℃ for 10 ±1 seconds
125 ±5 ℃ for 96 ±4 hours
Rated voltage for 1000 hours, 70 ℃,
1.5 hours “ON“, 0.5 hours “OFF”
Rated voltage for 1000 hours, 40 ±2 ℃, 90~95 % RH,
1.5 hours “ON“, 0.5 hours “OFF”
245 ±5 ℃, 2 ±0.5 seconds
3 mm
--
50 V
Method
IEC60115-1-4.19
IEC60115-1-4.13
IEC60115-1-4.18
IEC60115-1-4.23.2
IEC60115-1-4.25.1
IEC60115-1-4.24
IEC60115-1-4.17
IEC60115-1-4.33
IEC60115-1-4.7
IEC60115-1-4.6
Test Limits ΔR
≤±(3 % + 0.1 Ω)
≤±(3 % + 0.1 Ω)
≤±(3.0 % + 0.1 Ω)
≤±(2.0 % + 0.1 Ω)
≤±(5.0 % + 0.1 Ω)
≤±(5.0 % + 0.1 Ω)
≥95 % of area covered
≤±(1.0 % + 0.1 Ω)
>50 V
≥1 GΩ
Soldering Profile for RoHS Compliant Chip Resistors and Arrays
275
<1> Maximum of 20 seconds between
+255 °C and +260 °C
<1> 255 °C
225
175
150 °C
220 °C
190 °C
60 - 90
seconds
260 °C peak
Ramp Down
6 °C/second
125
60 - 120 seconds
10 seconds minimum
75
Ramp Up
3 °C/second maximum
25
0
50
100
150
200
250
300
Time (seconds)
Packaging Dimensions (Conforms to EIA RS-481A)
4.0 ± 0.1
(0.157 ± 0.004)
1.5 + 0.1/-0 DIA.
(0.059 + 0.004/-0)
0.27 ± 0.05
(0.011 ± 0.002)
1.75 ± 0.1
(0.069 ± 0.004)
0.68 ± 0.05
(0.027 ± 0.002)
0.38 ± 0.05
(0.015 ± 0.002)
2.0 ± 0.1
(0.079 ± 0.004)
3.5 ± 0.05
(0.138 ± 0.002)
8.0 ± 0.3
(0.315 ± 0.012)
Direction of Feeding
Paper
(Punched)
13.0 ± 0.5
(.512 ± .020)
2.0
(.080)
20.5
(.807)
60.0 +1/-0
(2.362 +0.04/-0)
178.0 ± 2.0
(7.008 ± .080)
REV. 08/15
DIMENSIONS:
MM
(INCHES)
11.4 ± 1.1
(0.449 ± 0.043)
Specifications are subject to change without notice.
The device characteristics and parameters in this data sheet can and do vary in different applications and actual device performance may vary over time.
Users should verify actual device performance in their specific applications.

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