AD1315 데이터 시트보기 (PDF) - HANAMICRON

부품명

상세내역

제조사

AD1315

High Speed Active Load with Inhibit Mode

HANAMICRON 

AD1315

APPLICATIONS

The AD1315 has been optimized to function as an active load

in an ATE test system. Figure 14 shows a block diagram illus-

trating the electronics behind a single pin of a high speed digital

functional test system with the ability to test I/O pins on logic

devices. The AD1315 active load, AD1321 or AD1324 pin

driver, AD1317 high speed dual comparator and the AD664

quad 12-bit voltage DAC would comprise the pin electronic

portion of the test system. Such a system could operate at

100 MHz with the AD1321 (200 MHz with the AD1324) in a

data mode or 50 MHz (100 MHz) in the I/O mode.

The VCOM input sets the commutation voltage of the active load.

With DUT output voltage above VCOM, the load will sink cur-

rent (IOH). With DUT output voltage below VCOM, the load will

source current (IOL). Like the IOH and IOL return lines, the VCOM

must be able to sink or source 50 mA, therefore a standard op

amp will not suffice. An op amp with an external complemen-

tary output stage or a high power op amp such as the AD842

will work well here. A typical application is shown in Figure 15.

LAYOUT CONSIDERATIONS

IOHRTN and IOLRTN may be connected to any potential between

–2 V and +7 V. These return points must be able to source or

sink 50 mA, since the IOH and IOL programmed currents are

diverted here in the inhibit mode. The RTNs may be connected

to a suitable GND. However, to keep transient ground currents

to a minimum, they are typically tied to the VCOM programming

voltage point.

Figure 14. High Speed Digital Test System Block Diagram

REV. A

Figure 15. Suggested IOHRTN, IOLRTN, VCOM Hookup

–7–

Share Link: