AD9040A(RevD) 데이터 시트보기 (PDF) - Analog Devices
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AD9040A Datasheet PDF : 16 Pages
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AD9040A
Parameter (Conditions)
Temp
Test
Level
AD9040AJN/AD9040AJR
Min
Typ
Max
Unit
ENCODE INPUT
Logic 1 Voltage
Full
VI
Logic 0 Voltage
Full
VI
Logic 1 Current
Full
VI
Logic 0 Current
Full
VI
Input Capacitance
25°C
V
Encode Pulsewidth (High) (tEH)7
25°C
IV
Encode Pulsewidth (Low) (tEL)7
25°C
IV
4.0
14
10
10
V
1.0
V
±1
µA
±1
µA
pF
100
ns
100
ns
DIGITAL OUTPUTS
Logic 1 Voltage
Full
VI
4.95
V
OBSOLETE Logic 0 Voltage
Output Coding
Full
VI
0.05
V
Offset Binary
POWER SUPPLY
VD Supply Current
Full
VI
+VS Supply Current
–VS Supply Current
Full
VI
Full
VI
Power Dissipation
Full
VI
Power Supply Rejection Ratio (PSRR)8 25°C
I
13
20
mA
89
110
mA
87
105
mA
0.94
1.2
W
± 15
mV/V
NOTES
1Gain temperature coefficient is for a converter using internal reference; temperature coefficient is for band gap reference only.
2Output propagation delay (tPD) is measured from the 50% point of the falling edge of the encode command to the min/max voltage levels of the digital outputs with
10 pF maximum loads.
3Minimum values apply to AD9040AJR only.
4RMS signal to rms noise with analog input signal 1 dB below full scale at specified frequency.
5Encode = 32 MSPS.
6Third order intermodulation measured with analog input frequencies of 2.3 MHz and 2.4 MHz at 7 dB below full scale.
7For rated performance at 40 MSPS, duty cycle of encode command should be 50% ± 10%.
8Measured as the ratio of the change in offset voltage for a 5% change in +V S or –VS.
Specifications subject to change without notice.
EXPLANATION OF TEST LEVELS
Test Level
I 100% production tested.
II 100% production tested at 25°C and sample tested at speci-
fied temperatures. AC testing done on sample basis.
III Sample tested only.
IV Parameter is guaranteed by design and characterization
testing.
V Parameter is a typical value only.
VI All devices are 100% production tested at 25°C. 100%
production tested at temperature extremes for military tem-
perature devices; guaranteed by design and characterization
testing for industrial devices.
REV. D
–3–
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