PALCE22V10-25KMB 데이터 시트보기 (PDF) - Cypress Semiconductor
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PALCE22V10-25KMB Datasheet PDF : 13 Pages
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PALCE22V10
]
Electrical Characteristics Over the Operating Range[2]
Parameter
Description
Test Conditions
VOH
VOL
VIH
VIL[4]
IIX
IOZ
ISC
ICC1
ICC2[6]
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
VCC = Min.,
VIN = VIH or VIL
IOH = –3.2 mA
IOH = –2 mA
Com’l
Mil/Ind
VCC = Min.,
VIN = VIH or VIL
IOL = 16 mA
IOL = 12 mA
Com’l
Mil/Ind
Guaranteed Input Logical HIGH Voltage for All Inputs[3]
Guaranteed Input Logical LOW Voltage for All Inputs[3]
Input Leakage Current
Output Leakage Current
Output Short Circuit Current
Standby Power Supply
Current
VSS < VIN < VCC, VCC = Max.
VCC = Max., VSS < VOUT < VCC
VCC = Max., VOUT = 0.5V[5,6]
VCC = Max.,
VIN = GND,
Outputs Open in
Unprogrammed
Device
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
Com’l
Mil/Ind
Operating Power Supply
Current
VCC = Max., VIL =
0V, VIH = 3V,
Output Open, De-
vice Programmed
as a 10-Bit
Counter,
f = 25 MHz
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
Com’l
Com’l
Mil/Ind
Mil/Ind
Min.
2.4
2.0
–0.5
–10
–40
–30
Max. Unit
V
0.5 V
V
0.8 V
10 µA
40 µA
–130 mA
90 mA
130 mA
120 mA
120 mA
110 mA
140 mA
130 mA
130 mA
Capacitance[6]
Parameter
CIN
COUT
Description
Input Capacitance
Output Capacitance
Test Conditions
VIN = 2.0V @ f = 1 MHz
VOUT = 2.0V @ f = 1 MHz
Min.
Max.
10
10
Unit
pF
pF
]
Endurance Characteristics[6]
Parameter
Description
Test Conditions
Min. Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions 100
Cycles
Notes:
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. VIL (Min.) is equal to -3.0V for pulse durations less than 20 ns.
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
6. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-03027 Rev. **
Page 4 of 13
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