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MJD112(2004) 데이터 시트보기 (PDF) - ON Semiconductor

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MJD112
(Rev.:2004)
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MJD112 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
MJD112 (NPN) MJD117 (PNP)
ACTIVE−REGION SAFE−OPERATING AREA
10
7
5
100 ms
3
2
500 ms
1
0.7
1 ms
5 ms
0.5
dc
0.3
0.2
BONDING WIRE LIMITED
0.1
THERMAL LIMIT
SECOND BREAKDOWN LIMIT
TJ = 150°C
CURVES APPLY BELOW RATED VCEO
2 3 5 7 10
20 30 50 70 100
200
VCE, COLLECTOR−EMITTER VOLTAGE (VOLTS)
Figure 4. Maximum Rated Forward Biased
Safe Operating Area
TA TC
2.5 25
2 20
1.5 15
1 10
0.5 5
00
25
TA
TC
SURFACE
MOUNT
50
75
100
125
15
T, TEMPERATURE (°C)
Figure 5. Power Derating
There are two limitations on the power handling ability of
a transistor: average junction temperature and second
breakdown. Safe operating area curves indicate IC − VCE
limits of the transistor that must be observed for reliable
operation; i.e., the transistor must not be subjected to greater
dissipation than the curves indicate.
The data of Figures 5 and 6 is based on TJ(pk) = 150_C;
TC is variable depending on conditions. Second breakdown
pulse limits are valid for duty cycles to 10% provided TJ(pk)
< 150_C. TJ(pk) may be calculated from the data in
Figure 4. At high case temperatures, thermal limitations will
reduce the power that can be handled to values less than the
limitations imposed by second breakdown.
200
TC = 25°C
100
70
50
30
20
10
0.04 0.06 0.1
PNP
NPN
0.2 0.4 0.6 1
Cob
Cib
2 4 6 10 20 40
VR, REVERSE VOLTAGE (VOLTS)
Figure 6. Capacitance
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