M27V320-100M1 데이터 시트보기 (PDF) - STMicroelectronics

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M27V320-100M1

32 Mbit (4Mb x8 or 2Mb x16) OTP EPROM

STMicroelectronics 

M27V320

Table 5. AC Measurement Conditions

Input Rise and Fall Times

Input Pulse Voltages

Input and Output Timing Ref. Voltages

High Speed

≤ 10ns

0 to 3V

1.5V

Standard

≤ 20ns

0.4V to 2.4V

0.8V and 2V

Figure 4. AC Testing Input Output Waveform

Figure 5. AC Testing Load Circuit

1.3V

High Speed

3V

t(s) 0V

duc Standard

Pro t(s) 2.4V

bsolete Produc 0.4V

1.5V

2.0V

0.8V

AI01822

DEVICE

UNDER

TEST

1N914

3.3kΩ

CL

OUT

CL = 30pF for High Speed

CL = 100pF for Standard

CL includes JIG capacitance

AI01823B

) - O lete Table 6. Capacitance (1) (TA = 25 °C, f = 1 MHz)

t(s so Symbol

Parameter

Test Condition

uc b CIN

Input Capacitance

VIN = 0V

d - O COUT

Output Capacitance

VOUT = 0V

Pro t(s) Note: 1. Sampled only, not 100% tested.

Min

Max

Unit

10

pF

12

pF

te c The M27V320 has two control functions, both of

le u which must be logically active in order to obtain

d data at the outputs. In addition the Word-wide or

so ro Byte-wide organisation must be selected.

b P Chip Enable (E) is the power control and should be

O te used for device selection. Output Enable (GVPP) is

the output control and should be used to gate data

le to the output pins independent of device selection.

o Assuming that the addresses are stable, the ad-

s dress access time (tAVQV) is equal to the delay

Obfrom E to output (tELQV). Data is available at the

output after a delay of tGLQV from the falling edge

of GVPP, assuming that E has been low and the

addresses have been stable for at least tAVQV-

tGLQV.

Standby Mode

The M27V320 has standby mode which reduces

the supply current from 50mA to 100µA. The

M27V320 is placed in the standby mode by apply-

ing a CMOS high signal to the E input. When in the

standby mode, the outputs are in a high imped-

ance state, independent of the GVPP input.

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