TB62705CPG_09 데이터 시트보기 (PDF) - Toshiba

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TB62705CPG_09

TOSHIBA Bi−CMOS INTEGRATED CIRCUIT SILICON MONOLITHIC

Toshiba 

TEST CIRCUIT

DC characteristics

AC characteristics

TB62705CPG/CFG/CFNG

OUTn

OUTn

OUTn

OUTn

Precaution on Use

Utmost care is necessary in the design of the output line, VCC (VDD) and GND line since the IC may be damaged

due to short-circuits between outputs, air contamination faults, or faults caused by improper grounding.

7

2005-10-06

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