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SPT7760AIK 데이터 시트보기 (PDF) - Signal Processing Technologies

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SPT7760AIK
SPT
Signal Processing Technologies SPT
SPT7760AIK Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
ELECTRICAL SPECIFICATIONS
TJ = TC = TA = +25 °C , VEE=-5.2 V, VRB=-2.00 V, VRM=-1.0 V, VRT=0.00 V, fclk=1 GHz, Duty Cycle=50%, unless otherwise specified.
PARAMETERS
Dynamic Performance
Signal-to-Noise and Distortion
fIN = 50 MHz
fIN = 250 MHz
Spurious Free Dynamic Range
fIN = 50 MHz
fIN = 250 MHz
Digital Inputs
Input High Voltage
(CLK, NCLK)
Input Low Voltage
(CLK, NCLK)
Clock Pulse Width High (tPWH)
Clock Pulse Width Low (tPWL)
Digital Outputs
Logic "1" Voltage
Logic "0" Voltage
Rise Time
Fall Time
Power Supply Requirements
Voltage VEE
Current IEE
Power Dissipation
TEST
CONDITIONS
20% to 80%
20% to 80%
TEST
LEVEL
SPT7760A
SPT7760B
MIN TYP MAX MIN TYP MAX UNITS
I
42
I
35
I
47
I
39
40
dB
33
dB
43
dB
35
dB
I
-1.1 -0.7
-1.1 -0.7
V
I
-1.8
-1.5
-1.8 -1.5 V
I
0.5 0.4
0.5 0.4
ns
I
0.5 0.4
0.5 0.4
ns
I
-1.1 -0.9
-1.1 -0.9
V
I
-1.8
-1.5
-1.8 -1.5 V
V
450
450
ps
V
450
450
ps
IV
-4.95 -5.2 -5.45 -4.95 -5.2 -5.45 V
I
1.05
1.2
1.05 1.2 A
I
5.5
6.25
5.5 6.25 W
Typical Thermal Impedance: θJC = +4 °C/W.
TEST LEVEL CODES
TEST LEVEL TEST PROCEDURE
All electrical characteristics are subject to the
I
100% production tested at the specified temperature.
following conditions:
II
100% production tested at TA=25 °C, and sample
All parameters having min/max specifications
tested at the specified temperatures.
are guaranteed. The Test Level column indi-
III
QA sample tested only at the specified temperatures.
cates the specific device testing actually per-
IV
Parameter is guaranteed (but not tested) by design
formed during production and Quality Assur-
and characterization data.
ance inspection. Any blank section in the data
V
Parameter is a typical value for information purposes
column indicates that the specification is not
only.
tested at the specified condition.
VI
100% production tested at TA = 25 °C. Parameter is
Unless otherwise noted, all tests are pulsed
guaranteed over specified temperature range.
tests; therefore, TJ = TC = TA.
SPT
3
SPT7760
3/10/97

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