NXP Semiconductors
NX3DV2567
Low-ohmic four-pole double-throw analog switch
11.3 ON resistance test circuit and graphs
VIL or VIH
VCC
VSW
V
S
nY0 1
nZ
nY1 2
switch
switch S
1
VIL
2
VIH
VI
GND
RON = VSW / ISW.
ISW
001aam601
Fig 7. Test circuit for measuring ON resistance
0.8
RON
(Ω)
0.6
0.4
001aam602
(1)
(2)
0.2
0
0
1
2
3
VI (V)
(1) VCC = 1.8 V.
(2) VCC = 2.7 V.
Fig 8. Typical ON resistance as a function of input
voltage (supply path switch)
1.0
RON
(Ω)
0.8
0.6
0.4
001aag566
(1)
(2)
(3)
(4)
1.0
RON
(Ω)
0.8
0.6
0.4
001aag568
(1)
(2)
(3)
(4)
0.2
0.2
0
0
1
2
3
VI (V)
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
(4) Tamb = −40 °C.
Fig 9. ON resistance as a function of input voltage;
VCC = 1.8 V (supply path switch)
0
0
1
2
3
VI (V)
(1) Tamb = 125 °C.
(2) Tamb = 85 °C.
(3) Tamb = 25 °C.
(4) Tamb = −40 °C.
Fig 10. ON resistance as a function of input voltage;
VCC = 2.7 V (supply path switch)
NX3DV2567
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 28 September 2010
© NXP B.V. 2010. All rights reserved.
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