HEF40174BT 데이터 시트보기 (PDF) - NXP Semiconductors.
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HEF40174BT Datasheet PDF : 14 Pages
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NXP Semiconductors
HEF40174B
Hex D-type flip-flop
a. Input waveforms
VI
negative
pulse
0V
VI
positive
pulse
0V
90 %
10 %
VM
10 %
tf
tr
90 %
VM
tW
90 %
VM
10 %
tr
tf
90 %
VM
10 %
tW
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VDD
VI
G
VO
DUT
RT
CL
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b. Test circuit
Fig 5.
Test data is given in Table 9.
Definitions for test circuit:
DUT = Device Under Test
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Test circuit for measuring switching times
Table 9. Measurement points and test data
Supply voltage
Input
VI
5 V to 15 V
VDD
VM
0.5VI
tr, tf
20 ns
Load
CL
50 pF
HEF40174B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 7 — 21 November 2011
© NXP B.V. 2011. All rights reserved.
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