74VHCT08BQ-Q100X 데이터 시트보기 (PDF) - NXP Semiconductors.

부품명

상세내역

제조사

74VHCT08BQ-Q100X

Quad 2-input AND gate

NXP Semiconductors. 

Nexperia

74VHC08-Q100; 74VHCT08-Q100

Quad 2-input AND gate

tW

VI 90 %

negative

pulse

VM

10 %

0V

tf

VI

positive

pulse

tr

90 %

VM

10 %

0V

tW

VM

tr

tf

VM

VI

G

VCC

VO

DUT

RT

VCC

RL S1

CL

open

001aad983

Fig 7.

Test data is given in Table 9.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Load circuit for switching times

Table 9. Test data

Type

Input

74VHC08-Q100

74VHCT08-Q100

VI

VCC

3.0 V

tr, tf

 3.0 ns

 3.0 ns

Load

CL

15 pF, 50 pF

15 pF, 50 pF

RL

1 k

1 k

S1 position

tPHL, tPLH

open

open

tPZH, tPHZ

GND

GND

tPZL, tPLZ

VCC

VCC

74VHC_VHCT08_Q100

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 1 — 20 December 2013

© Nexperia B.V. 2017. All rights reserved

8 of 15

Share Link: