ATA8888-15MD 데이터 시트보기 (PDF) - Atmel Corporation
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ATA8888-15MD
Atmel Corporation
ATA8888-15MD Datasheet PDF : 12 Pages
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2. Grade 0 Qualification
The ATmega16M1/ATmega16M1/32M1/32C1/64M1/64C1/ATA8888/ATmega64M1/ATmega64C1 has been developed and
manufactured according to the most stringent quality assurance requirements of ISO-TS-16949 and verified during product
qualification as per AEC-Q100 grade 0.
AEC-Q100 qualification relies on temperature accelerated stress testing. High temperature field usage however may result in
less significant stress test acceleration. In order to prevent the risk that
ATmega16M1/ATmega16M1/32M1/32C1/64M1/64C1/ATA8888/ATmega64M1/ATmega64C1 lifetime would not satisfy the
application end-of-life reliability requirements, Atmel® has extended the testing, whenever applicable (High Temperature
Operating Life Test, High Temperature Storage Life, Data Retention, Thermal Cycles), far beyond the AEC-Q100 requirements.
Thereby, Atmel verified the ATmega16M1/ATmega16M1/32M1/32C1/64M1/64C1/ATA8888/ATmega64M1/ATmega64C1 has a
long safe lifetime period after the grade 0 qualification acceptance limits.
The valid domain calculation depends on the activation energy of the potential failure mechanism that is considered. Therefore
any temperature mission profile which could exceed the AEC-Q100 equivalence domain shall be submitted to Atmel for a
thorough reliability analysis
Figure 2-1. AEC-Q100 Lifetime Equivalence
1000000
100000
10000
1000
100
10
1
0
20
40
60
80
100 120 140 160
Temperature (°C)
HTOL 0,59eV
HTSL 0,45eV
Atmel ATmega16M1/32M1/32C1/64M1/64C1 Automotive [DATASHEET]
6
7781E–AVR–03/12
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