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CAT1163

Supervisory Circuits with I2C Serial CMOS EEPROM, Precision Reset Controller and Watchdog Timer (16K)

ON Semiconductor 

CAT1163

SPECIFICATIONS

Table 2. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Temperature Under Bias

–55 to +125

°C

Storage Temperature

–65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

VCC with Respect to Ground

Package Power Dissipation Capability (TA = 25°C)

Lead Soldering Temperature (10 seconds)

−2.0 to VCC + 2.0

V

−2.0 to 7.0

V

1.0

W

300

°C

Output Short Circuit Current (Note 2)

100

mA

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

1. The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum

DC voltage on output pins is VCC +0.5 V, which may overshoot to VCC +2.0 V for periods of less than 20 ns.

2. Output shorted for no more than one second. No more than one output shorted at a time.

Table 3. RELIABILITY CHARACTERISTICS

Symbol

Parameter

Reference Test Method

Min

Max

NEND (Note 3) Endurance

MIL−STD−883, Test Method 1033

1,000,000

TDR (Note 3) Data Retention

MIL−STD−883, Test Method 1008

100

VZAP (Note 3) ESD Susceptibility

MIL−STD−883, Test Method 3015

2000

ILTH (Notes 3 & 4) Latch−Up

JEDEC Standard 17

100

3. This parameter is tested initially and after a design or process change that affects the parameter.

4. Latch−up protection is provided for stresses up to 100 mA on address and data pins from –1 V to VCC +1 V.

Units

Cycles/Byte

Years

Volts

mA

Table 4. D.C. OPERATING CHARACTERISTICS

VCC = 2.7 V to 6.0 V, unless otherwise specified.

Symbol

Parameter

Test Conditions

ICC

ISB

ILI

ILO

VIL

VIH

VOL1

Power Supply Current

Standby Current

Input Leakage Current

Output Leakage Current

Input Low Voltage

Input High Voltage

Output Low Voltage (SDA)

fSCL = 100 kHz

VCC = 3.3 V

VCC = 5 V

VIN = GND or VCC

VIN = GND or VCC

IOL = 3 mA, VCC = 3.0 V

Min

−1

VCC x 0.7

Typ

Max

3

40

50

2

10

VCC x 0.3

VCC + 0.5

0.4

Units

mA

mA

mA

mA

mA

V

V

V

Table 5. CAPACITANCE

TA = 25°C, f = 1.0 MHz, VCC = 5 V

Symbol

Test

CI/O (Note 3)

CIN (Note 3)

Input/Output Capacitance (SDA)

Input Capacitance (SCL)

Test Conditions

VI/O = 0 V

VIN = 0 V

Max

Units

8

pF

6

pF

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