RT9193-26GB 데이터 시트보기 (PDF) - Richtek Technology

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RT9193-26GB

300mA, Ultra-Low Noise, Ultra-Fast CMOS LDO Regulator

Richtek Technology 

RT9193

Parameter

Thermal Shutdown Temperature

Hysteresis

Symbol

ΔTSD

Test Conditions

Min Typ Max Units

--

30

--

°C

Note 1. Stresses listed as the above "Absolute Maximum Ratings" may cause permanent damage to the device. These are for

stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the

operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended

periods may remain possibility to affect device reliability.

Note 2. Devices are ESD sensitive. Handling precaution recommended.

Note 3. The device is not guaranteed to function outside its operating conditions.

Note 4. θJA is measured in the natural convection at TA = 25°C on a low effective thermal conductivity test board

(Single Layer, 1S) of JEDEC 51-3 thermal measurement standard.

Note 5. The dropout voltage is defined as VIN -VOUT, which is measured when VOUT is VOUT(NORMAL) − 100mV.

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DS9193-09 March 2007

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