24LC01 데이터 시트보기 (PDF) - Holtek Semiconductor

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24LC01

1K/2K 2-Wire CMOS Serial EEPROM

Holtek Semiconductor 

HT24LC01/02

Pin Description

Pin Name I/O

A0~A2

I

SDA

I/O

SCL

I

WP

I

VSS

—

VCC

I

Address inputs

Serial data inputs/output

Serial clock data input

Write protect

Negative power supply

Positive power supply

Description

Absolute Maximum Ratings

Operating Temperature (Commercial) .................................................................................. 0°C to 70°C

Storage Temperature ........................................................................................................ –50°C to 125°C

Applied VCC Voltage with Respect to VSS ....................................................................... –0.3V to 6.0V

Applied Voltage on any Pin with Respect to VSS ................................................................... –0.3V to VCC+0.3V

Note: These are stress ratings only. Stresses exceeding the range specified under “Absolute Maxi-

mum Ratings” may cause substantial damage to the device. Functional operation of this device

at other conditions beyond those listed in the specification is not implied and prolonged

exposure to extreme conditions may affect device reliability.

D.C. Characteristics

Ta=0°C to 70°C

Symbol

Parameter

Test Conditions

VCC Conditions

Min. Typ. Max. Unit

VCC

Operating Voltage

—

—

2.4 —

5.5

V

ICC1

Operating Current

5V Read at 100kHz —

—

2

mA

ICC2

Operating Current

5V Write at 100kHz —

—

5

mA

VIL

Input Low Voltage

—

—

–1

— 0.3VCC V

VIH

Input High Voltage

—

—

0.7VCC — VCC+0.5 V

VOL

Output Low Voltage

2.4V IOL=2.1mA

—

—

0.4

V

ILI

Input Leakage Current

5V VIN=0 or VCC

—

—

1

µA

ILO

Output Leakage Current

5V VOUT=0 or VCC

—

—

1

µA

ISTB1 Standby Current

5V VIN=0 or VCC

—

—

5

µA

ISTB2 Standby Current

2.4V VIN=0 or VCC

—

—

4

µA

CIN

Input Capacitance (See Note) — f=1MHz 25°C

—

—

6

pF

COUT Output Capacitance (See Note) — f=1MHz 25°C

—

—

8

pF

Note: These parameters are periodically sampled but not 100% tested

2

6th May ’99

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