XC7SH08 데이터 시트보기 (PDF) - NXP Semiconductors.

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XC7SH08

2-input AND gate

NXP Semiconductors. 

NXP Semiconductors

12. Waveforms

XC7SH08

2-input AND gate

A, B input

Y output

VM

tPHL

VM

Measurement points are given in Table 9.

Fig 5. Input (A and B) to output (Y) propagation delays

Table 9. Measurement point

Type

Input

XC7SH08

VI

GND to VCC

VM

0.5 × VCC

tPLH

mna116

Output

VM

0.5 × VCC

PULSE

VI

GENERATOR

VCC

VO

DUT

RT

CL

mna101

Fig 6.

Test data is given in Table 10. Definitions for test circuit:

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

Load circuitry for switching times

Table 10. Test data

Type

XC7SH08

Input

VI

VCC

tr, tf

≤ 3.0 ns

Load

CL

15 pF, 50 pF

Test

tPLH, tPHL

XC7SH08_1

Product data sheet

Rev. 01 — 1 September 2009

© NXP B.V. 2009. All rights reserved.

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