ESD5102 데이터 시트보기 (PDF) - ON Semiconductor

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ESD5102

ESD Protection Diodes

ON Semiconductor 

ESD5102

IEC 61000−4−2 Spec.

Level

First Peak

Test Volt- Current Current at

age (kV)

(A)

30 ns (A)

1

2

7.5

4

2

4

15

8

3

6

22.5

12

4

8

30

16

Current at

60 ns (A)

2

4

6

8

IEC61000−4−2 Waveform

Ipeak

100%

90%

I @ 30 ns

I @ 60 ns

10%

Figure 6. IEC61000−4−2 Spec

tP = 0.7 ns to 1 ns

Transmission Line Pulse (TLP) Measurement

Transmission Line Pulse (TLP) provides current versus

voltage (I−V) curves in which each data point is obtained

from a 100 ns long rectangular pulse from a charged

transmission line. A simplified schematic of a typical TLP

system is shown in Figure 7. TLP I−V curves of ESD

protection devices accurately demonstrate the product’s

ESD capability because the 10s of amps current levels and

under 100 ns time scale match those of an ESD event. This

is illustrated in Figure 8 where an 8 kV IEC 61000−4−2

current waveform is compared with TLP current pulses at

8 A and 16 A. A TLP I−V curve shows the voltage at which

the device turns on as well as how well the device clamps

voltage over a range of current levels.

L

50 W Coax

Cable

S Attenuator

÷

50 W Coax

Cable

10 MW

IM VM

VC

DUT

Oscilloscope

Figure 7. Simplified Schematic of a Typical TLP

System

Figure 8. Comparison Between 8 kV IEC 61000−4−2 and 8 A and 16 A TLP Waveforms

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