FM24CL64B(2014) 데이터 시트보기 (PDF) - Cypress Semiconductor

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FM24CL64B
(Rev.:2014)

64-Kbit (8K × 8) Serial (I2C) F-RAM

Cypress Semiconductor 

FM24CL64B

Data Retention and Endurance

Parameter

Description

TDR

Data retention

NVC

Endurance

Test condition

TA = 85 C

TA = 75 C

TA = 65 C

Over operating temperature

Min

10

38

151

1014

Max

Unit

–

Years

–

–

–

Cycles

Capacitance

Parameter [4]

Description

CO

Output pin capacitance (SDA)

CI

Input pin capacitance

Test Conditions

TA = 25 C, f = 1 MHz, VDD = VDD(typ)

Max

Unit

8

pF

6

pF

Thermal Resistance

Parameter [4]

JA

JC

Description

Thermal resistance

(junction to ambient)

Thermal resistance

(junction to case)

Test Conditions

Test conditions follow standard test methods

and procedures for measuring thermal

impedance, per EIA / JESD51.

8-pin SOIC

147

47

8-pin TDFN Unit

28

C/W

30

C/W

Note

4. This parameter is periodically sampled and not 100% tested.

Document Number: 001-84458 Rev. *D

Page 10 of 19

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