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FQP3P50 데이터 시트보기 (PDF) - Fairchild Semiconductor

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FQP3P50
Fairchild
Fairchild Semiconductor Fairchild
FQP3P50 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Elerical Characteristics
Symbol
Parameter
TC = 25°C unless otherwise noted
Test Conditions
Min Typ Max Units
Off Characteristics
BVDSS
BVDSS
/ TJ
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSSF
IGSSR
Gate-Body Leakage Current, Forward
Gate-Body Leakage Current, Reverse
VGS = 0 V, ID = -250 µA
-500
ID = -250 µA, Referenced to 25°C --
VDS = -500 V, VGS = 0 V
--
VDS = -400 V, TC = 125°C
--
VGS = -30 V, VDS = 0 V
--
VGS = 30 V, VDS = 0 V
--
--
0.42
--
--
--
--
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
Static Drain-Source
On-Resistance
gFS
Forward Transconductance
VDS = VGS, ID = -250 µA
-3.0 --
VGS = -10 V, ID = -1.35 A
-- 3.9
VDS = -50 V, ID = -1.35 A (Note 4)
--
2.35
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = -25 V, VGS = 0 V,
f = 1.0 MHz
-- 510
--
70
-- 9.5
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = -250 V, ID = -2.7 A,
RG = 25
--
12
--
56
--
35
(Note 4, 5)
--
45
VDS = -400 V, ID = -2.7 A,
--
18
VGS = -10 V
-- 3.6
(Note 4, 5)
--
9.2
--
--
-1
-10
-100
100
-5.0
4.9
--
660
90
12
35
120
80
100
23
--
--
V
V/°C
µA
µA
nA
nA
V
S
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
-2.7
A
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
-- -10.8
A
VSD
Drain-Source Diode Forward Voltage VGS = 0 V, IS = -2.7 A
--
--
-5.0
V
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
VGS = 0 V, IS = -2.7 A,
-- 270
--
ns
dIF / dt = 100 A/µs
(Note 4)
--
1.5
--
µC
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 62mH, IAS = -2.7A, VDD = -50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD -2.7A, di/dt 200A/µs, VDD BVDSS, Starting TJ = 25°C
4. Pulse Test : Pulse width 300µs, Duty cycle 2%
5. Essentially independent of operating temperature
©2000 Fairchild Semiconductor International
Rev. A, August 2000

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