FAN3121(2012) 데이터 시트보기 (PDF) - Fairchild Semiconductor

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FAN3121
(Rev.:2012)

Single 9A High-Speed, Low-Side Gate Driver

Fairchild Semiconductor 

Absolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended.

In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.

The absolute maximum ratings are stress ratings only.

Symbol

Parameter

VDD

VDD to GND

VEN EN to GND

VIN IN to GND

VOUT OUT to GND

TL Lead Soldering Temperature (10 Seconds)

TJ

Junction Temperature

TSTG Storage Temperature

ESD Human Body Model, JEDEC JESD22-A114

Min.

Max. Unit

-0.3

20.0

V

GND - 0.3 VDD + 0.3 V

GND - 0.3 VDD + 0.3 V

GND - 0.3 VDD + 0.3 V

+260

ºC

-55

+150

ºC

-65

+150

ºC

2

kV

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended

operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not

recommend exceeding them or designing to Absolute Maximum Ratings.

Symbol

Parameter

VDD Supply Voltage Range

VEN Enable Voltage EN

VIN

Input Voltage IN

TA

Operating Ambient Temperature

Min.

4.5

0

0

-40

Max.

18.0

VDD

VDD

+125

Unit

V

V

V

ºC

© 2012 Fairchild Semiconductor Corporation

FAN3121 / FAN3122_F085 • Rev. 1.0.0

5

www.fairchildsemi.com

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