SVFB21A475M 데이터 시트보기 (PDF) - NEC => Renesas Technology
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SVFB21A475M Datasheet PDF : 16 Pages
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SV/F SERIES
GUIDE TO APPLICATIONS FOR TANTALUM CHIP CAPACITORS
The failure of the solid tantalum capacitor is mostly classified into a short-circuiting mode and a large leakage
current mode.
SV/F series features a built-in-fuse to minimize circuit damage from short circuiting current, but the fuse may
not work under some environmental conditions.
Refer to the following in detail for reliable circuit design.
1. Expecting Reliability
SV/F series tantalum chip capacitors are typically applied to decoupling, blocking, bypassing and filtering.
The SV/F series has a very high reliability (low failure rate) in the field. For example, the maximutn field failure
rate of an SV/F series capacitor with a DC rated voltage of 16 V is 0.0004% / 1000 hour (4 Fit) at an applied voltage
of 5 V, operating temperature of 25˚C and series resistance of 3 Ω.
The maximum failure rate in the field is estimated by the following expression :
λ = λ0
3
V
T-T0
× 2 10
V0
λ : Maximum field failure rate
λ0 : 1% 1000 hour (The failure rate of the SV/ F series at the full DC rated voltage at operating
temperature of 85˚C and series resistance of 3 Ω.)
V : Applied voltage in actual use
V0 : DC Rated voltage
T : Operating temperature in actual use
T0 : 85˚C
The nomograph is provided for quick estimation of
120
maximum fieid failure rates.
102
7
110
4
Connect operating temperature T and applied
voltage ratio V/ V0 of interest with a straight line.
2
The failure rate multiplier F is given at the inter-
101
section of this line with the model scale. The failure
100
7
rate is obtained as λ = λ 0 •F.
4
2
90
1.0
Examples :
100
7
4
0.9
Given V/ V0 = 0.4 and T = 45˚C, read
0.8
F = 4 × 10 –3
80
2
0.7
Hence, λ = 0.004%/1000 hour (40 Fit)
10–1
7
0.6
Given V/ V0 = 0.3 and T = 25˚C, read
F = 4 × 10 –4
0.5
Hence, λ = 0.0004%/1000 hour (4 Fit)
70
4
2
0.4
10–2
60
7
4
0.3
2
50
10–3
7
0.2
4
40
2
10–4
7
30
4
2
0.1
10–5
20
DATA SHEET EC0003EJ3V1DS00
11
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