FSA2567MPX 데이터 시트보기 (PDF) - ON Semiconductor

부품명

상세내역

제조사

FSA2567MPX

Low-Power, Dual SIM Card Analog Switch

ON Semiconductor 

Test Diagrams (Continued)

nVSIM, nRST,

nCLK or nDAT

VSW1

GND

VSW2

GND

Sel

tRISE = 2.5ns

VSIM ,RST,

CLK or DAT

CL

RL

GND

VCC

Input-

VSel 10%

VOUT 0V

VOUT

0.9 • VOUT

90%

VCC/2

tBBM

0.9 • VOUT

RL and CL are functions of the application

environment (see tables for specific values).

CL includes test fixture and stray capacitance.

Figure 15. Break-Before-Make Interval Tim ing

VSEL

GND

Network Analyzer

RS

VIN

GND

VS

GND

GND

VOUT

RT

RS and RT are functions of the application

environment (see tables for specific values).

GND

Figure 16. Bandw idth

Network Analyzer

RS

RT

GND

VSel

GND

GND

GND

RS and RT are functions of the application

environment (see tables for specific values).

VIN

VS

GND

VOUT

RT

GND

Off isolation = 20 Log (VOUT / VIN)

Figure 17. Channel Off Isolation

Network Analyzer

NC

RS

GND VIN

VS

VSel

GND

GND

RT

GND

GND

RS and RT are functions of the application

environment (see tables for specific values).

RT VOUT

GND

Crosstalk= 20 Log (VOUT / VIN)

Figure 18. Non-Adjacent Channel-to-Channel Crosstalk

nVSIM, nRST,

nCLK, or nDAT

Capacitance

Meter

f = 1MHz

nVSIM, nRST,

nCLK, or nDAT

VSel = 0 or VCC

VSIM , RST,

CLK, or DAT

Capacitance

Meter

f = 1MHz

nVSIM , nRST,

nCLK, or nDAT

VSel = 0 or VCC

Figure 19. Channel Off Capacitance

Figure 20. Channel On Capacitance

www.onsemi.com

9

Share Link: