TD62382AFN 데이터 시트보기 (PDF) - Toshiba

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TD62382AFN

TOSHIBA BIPOLAR DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC

Toshiba 

TEST CIRCUIT

1. ICEX

2. VCE (sat)

TD62382AFN

3. IIN (ON)

4. IIN (OFF)

5. VIN (ON)

6. ICC

7. tON, tOFF

Note 1: Pulse Width 50 µs, Duty Cycle 10%

Output Impedance 50 Ω, tr ≤ 10 ns, tf ≤ 5 ns

Note 2: CL includes probe and jig capacitance.

PRECAUTIONS for USING

This IC does not include built-in protection circuits for excess current or overvoltage.

If this IC is subjected to excess current or overvoltage, it may be destroyed.

Hence, the utmost care must be taken when systems which incorporate this IC are designed.

Utmost care is necessary in the design of the output line, VCC and GND line since IC may be destroyed due to

short−circuit between outputs, air contamination fault, or fault by improper grounding.

3

2001-07-16

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