STK15C68(2011) 데이터 시트보기 (PDF) - Cypress Semiconductor

부품명

상세내역

제조사

STK15C68
(Rev.:2011)

256-Kbit (32 K × 8) PowerStore nvSRAM

Cypress Semiconductor 

STK15C88

Data Retention and Endurance

Parameter

DATAR

NVC

Description

Data Retention

Nonvolatile STORE Operations

Min

100

1,000

Unit

Years

K

Capacitance

. In the following table, the capacitance parameters are listed.[4]

ly Parameter

on CIN

s COUT

Description

Input Capacitance

Output Capacitance

Test Conditions

TA = 25 C, f = 1 MHz,

VCC = 0 to 3.0 V

Max

Unit

5

pF

7

pF

gram Thermal Resistance

pro In the following table, the thermal resistance parameters are listed.[4]

n Parameter

ctio JA

igns. rodu JC

Description

Thermal Resistance

(Junction to Ambient)

Thermal Resistance

(Junction to Case)

Test Conditions

28-pin SOIC 28-pin SOIC

(300 mil) (330 mil)

Test conditions follow standard test methods and

procedures for measuring thermal impedance,

per EIA / JESD51.

TBD

TBD

TBD

TBD

Unit

C/W

C/W

des ing p Figure 4. AC Test Loads

r new ongo 5.0V

R1 480

nded sfoupport Output

30 pF

R2

255

ecommcteion to AC Test Conditions

t r du Input Pulse Levels .................................................. 0 V to 3 V

o ro Input Rise and Fall Times (10% - 90%)........................ <5 ns

N In p Input and Output Timing Reference Levels ................... 1.5 V

Note

4. These parameters are guaranteed by design and are not tested.

Document Number: 001-50593 Rev. *C

Page 8 of 17

[+] Feedback

Share Link: