CD22101 데이터 시트보기 (PDF) - Harris Semiconductor

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CD22101

CMOS 4 x 4 x 2 Crosspoint Switch with Control Memory

Harris Semiconductor 

CD22101, CD22102

Test Circuits and Waveforms (Continued)

VDD

1

24

IL

2

23

3

22

4

21

5

20

6

19

7

18

8

17

9

16

10

15

11

14

12

13

VSS

FIGURE 4. OFF SWITCH INPUT OR OUTPUT LEAKAGE

CURRENT TEST CIRCUIT (16 OF 32 SWITCHES)

ON

VIS

SW

10kΩ

VOS

50pF

SW = ANY CROSSPOINT

STROBE = DATA - IN = VDD

VDD

VIS

50%

0

tPLH

VDD

VOS

50%

0

50%

tPHL

50%

FIGURE 5. PROPAGATION DELAY TIME TEST CIRCUIT AND

WAVEFORMS (SIGNAL INPUT TO SIGNAL

OUTPUT, SWITCH ON)

DATA-IN

STROBE

VDD

VIS

SW

1kΩ

SW = ANY CROSSPOINT

VOS

50pF

VDD

STROBE 0

VDD

DATA-IN 0

VDD

VOS

0

tW

50%

tS

tH

50%

90%

tPHZ

tW

50%

tS

FIGURE 6. PROPAGATION DELAY TIME TEST CIRCUIT AND WAVEFORMS

(STROBE TO SIGNAL OUTPUT, SWITCH TURN-ON OR TURN-OFF)

50%

tH

tPZH

10%

DATA-IN

VDD

VIS

SW

1kΩ

SW = ANY CROSSPOINT

STROBE = VDD

VOS

50pF

VDD

DATA-IN

0

VDD

VOS

0

50%

tPZH

VIS

10%

VDD

1kΩ

VDD

DATA-IN

0

SW

VOS

VDD

50pF

VOS

0

FIGURE 7. PROPAGATION DELAY TIME TEST CIRCUIT AND WAVEFORMS

(DATA-IN TO SIGNAL OUTPUT, SWITCH TURN-ON TO HIGH OR LOW LEVEL)

50%

tPZL

90%

4-201

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