74HC132-Q100(2012) 데이터 시트보기 (PDF) - NXP Semiconductors.
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74HC132-Q100 Datasheet PDF : 18 Pages
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NXP Semiconductors
12. Waveforms
74HC132-Q100; 74HCT132-Q100
Quad 2-input NAND Schmitt trigger
VI
nA, nB input
GND
VOH
nY output
VOL
VM
tPHL
VY
tTHL
VM
VX
tPLH
tTLH
Fig 5.
Measurement points are given in Table 8.
VOL and VOH are typical voltage output levels that occur with the output load.
Input to output propagation delays
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Table 8. Measurement points
Type
Input
74HC132-Q100
74HCT132-Q100
VM
0.5VCC
1.3 V
Output
VM
0.5VCC
1.3 V
VX
0.1VCC
0.1VCC
VY
0.9VCC
0.9VCC
VI 90 %
negative
pulse
GND
VI
positive
pulse
10 %
GND
VM
10 %
tf
tr
90 %
VM
VI
G
RT
tW
tW
VCC
DUT
VM
tr
tf
VM
VO
CL
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Fig 6.
Test data is given in Table 9.
Definitions test circuit:
RT = termination resistance should be equal to output impedance Zo of the pulse generator.
CL = load capacitance including jig and probe capacitance.
Load circuitry for measuring switching times
74HC_HCT132_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 13 August 2012
© NXP B.V. 2012. All rights reserved.
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