IDT7187L 데이터 시트보기 (PDF) - Integrated Device Technology
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IDT7187L Datasheet PDF : 8 Pages
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IDT7187S/L
CMOS STATIC RAM 64K (64K x 1-BIT)
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
5ns
1.5V
1.5V
See Figures 1 and 2
2986 tbl 10
5V
DATAOUT
255Ω
480Ω
30pF*
MILITARY TEMPERATURE RANGE
DATAOUT
255Ω
5V
480Ω
5pF*
2986 drw 05
Figure 1. AC Test Load
*Includes scope and jig capacitances
2986 drw 06
Figure 2. AC Test Load
(for tHZ, tLZ, tWZ and tOW)
AC ELECTRICAL CHARACTERISTICS (VCC = 5.0V ± 10%, All Temperature Ranges)
7187S25 7187S35/45(1) 7187S55(1) 7187S70(1)
7187L25 7187L35/45(1) 7187L55(1) 7187L70(1)
7187S85(1)
7187L85(1)
Symbol
Parameter
Min. Max. Min. Max. Min. Max. Min. Max. Min. Max. Unit
Read Cycle
tRC
Read Cycle Time
25 — 35/45 — 55 — 70 — 85 — ns
tAA
Address Access Time
— 25 — 35/45 — 55 — 70 — 85 ns
tACS Chip Select Access Time
— 25 — 35/45 — 55 — 70 — 85 ns
tOH
tLZ(2)
tHZ(2)
tPU(2)
tPD(2)
Output Hold from Address Change
Output Selection to Output in Low-Z
Chip Deselect to Output in High-Z
Chip Select to Power-Up Time
Chip Deselect to Power-Down Time
5 — 5 — 5 — 5 — 5 — ns
5 — 5 — 5 — 5 — 5 — ns
— 12 — 17/20 — 30 — 30 — 40 ns
0 — 0 — 0 — 0 — 0 — ns
— 20 — 30/35 — 35 — 35 — 40 ns
NOTES:
1. –55°C to +125°C temperature range only.
2. This parameter guaranteed but not tested.
2986 tbl 11
6.2
5
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