SPT7851SIT 데이터 시트보기 (PDF) - Fairchild Semiconductor

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SPT7851SIT

10-BIT, 20 MSPS, 79 mW A/D CONVERTER

Fairchild Semiconductor 

ELECTRICAL SPECIFICATIONS

TA = TMIN–TMAX , VDD1 = VDD2 = VDD3 = 3.3 V, VREF– = 1.0 V, VREF+ = 2.0 V, Common Mode Voltage = 1.65 V, ƒCLK = 20 MSPS,

Bias 1 = 90 µA, Bias 2 = 9.5 µA, Differential Input, Duty Cycle = 50%, unless otherwise specified.

TEST

TEST

SPT7851

PARAMETERS

CONDITIONS

LEVEL

MIN

TYP

MAX UNITS

Dynamic Performance

Effective Number of Bits

ƒIN = 5.0 MHz

ƒIN = 10.0 MHz

Signal-To-Noise Ratio

ƒIN = 5.0 MHz

ƒIN = 10.0 MHz

Total Harmonic Distortion

ƒIN=5.0 MHz

ƒIN=10.0 MHz

Signal-To-Noise and Distortion

ƒIN = 5 MHz

ƒIN = 10 MHz

Spurious Free Dynamic Range

ƒIN = 5.0 MHz

ƒIN = 10.0 MHz

Differential Phase

Differential Gain

VI

9.0

9.3

Bits

V

9.0

Bits

VI

57

58

dB

V

58

dB

VI

–68

–61

dB

V

–60

dB

VI

56

58

dB

V

56

dB

VI

62

70

V

61

V

0.2

V

0.5

dB

dB

Degrees

%

Digital Inputs

Logic 1 Voltage

Logic 0 Voltage

Maximum Input Current Low

Maximum Input Current High

Input Capacitance

VIN = GND

VIN = VDD

VI

80% VDD

VI

VI

VI

V

20% VDD

±1

µA

±1

µA

1.8

pF

Digital Outputs

Logic 1 Voltage

Logic 0 Voltage

CLK to Output Delay Time (tD)

Power Supply Requirements

Supply Voltages

VDD1, VDD2, VDD3

Supply Current

IDD

Power Dissipation

Power Supply Rejection Ratio (PSRR)

IO = –2 mA

IO = +2 mA

VI

85% VDD

95% VDD

VI

0.1

IV

4

8

IV

2.8

3.3

VI

24

VI

79

V

67

V

0.4

V

12

ns

3.6

V

30

mA

100

mW

dB

TEST LEVEL CODES

TEST LEVEL TEST PROCEDURE

All electrical characteristics are subject to the

I

following conditions: All parameters having

II

min/max specifications are guaranteed. The

Test Level column indicates the specific device

III

testing actually performed during production

IV

and Quality Assurance inspection. Any blank

section in the data column indicates that the

specification is not tested at the specified con-

V

dition.

VI

100% production tested at the specified temperature.

100% production tested at TA = +25 °C, and sample tested

at the specified temperatures.

QA sample tested only at the specified temperatures.

Parameter is guaranteed (but not tested) by design and

characterization data.

Parameter is a typical value for information purposes only.

100% production tested at TA = +25 °C. Parameter is

guaranteed over specified temperature range.

SPT7851

3

8/1/00

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