MA3864 데이터 시트보기 (PDF) - Zarlink Semiconductor Inc
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MA3864 Datasheet PDF : 11 Pages
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MA3864
RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
GEC Plessey Semiconductors can provide radiation
testing compliant with MIL-STD-883 test method 1019,
Ionizing Radiation (Total Dose).
Total Dose (Basic function)
Total Dose (Function to specification)
Transient Upset
Neutron Hardness (Function to specification)
Single Event Upset (GSO 10% worst case)
Latch-up
1x105 Rad(Si)
1x106 Rad(Si)
>1011 Rad(Si)/sec
>1015 neutrons/cm2
4.3x10-11 errors/bitday
Not possible
Figure 14: Typical Radiation Hardness Parameters
ORDERING INFORMATION
Unique Circuit Designator
Mask Revision
Radiation Tolerance
x15Sx88nnxxxxxx
S Radiation Hard Processing
R 100 kRads (Si) Guaranteed
T 150 kRads (Si) Guaranteed
Q 300 kRads (Si) Guaranteed
For radiation levels above those
stated please contact Marketing
QA/QCI Process
(See Section 9 Part 4)
Test Process
(See Section 9 Part 3)
T TTL
C CMOS
Package Type
C Ceramic DIL (Solder Seal)
F Flatpack (Solder Seal)
For details of reliability, QA/QC, test and assembly
options, see ‘Manufacturing Capability and Quality
Assurance Standards’ Section 9.
Assembly Process
(See Section 9 Part 2)
Reliability Level
L Rel 0
C Rel 1
D Rel 2
E Rel 3/4/5/STACK
B Class B
S Class S
9
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