ISL21007 데이터 시트보기 (PDF) - Renesas Electronics
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ISL21007 Datasheet PDF : 20 Pages
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ISL21007
Absolute Voltage Ratings
Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Max Voltage VIN to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +6.5V
Max Voltage VOUT to GND (10s) . . . . . . . . . . . . . . . . . . . . . -0.5V to VOUT + 1
Voltage on “DNC” pins . . . . . . . . . No connections permitted to these pins.
ESD Rating
Human Body Model (HBM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6kV
Machine Model (MM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 600V
Charged Device Model (CDM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2kV
Environmental Operating Conditions
X-Ray Exposure (Note 4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10mRem
Thermal Information
Thermal Resistance (Typical, Note 5)
JA (°C/W)
8 Ld SOIC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
113.12
Continuous Power Dissipation (Note 5) . . . . . . . . . . . . . . . . . . . .TA = +70°C
8 Ld SOIC Derate 5.88mW/°C above +70°C. . . . . . . . . . . . . . . . . . 471mW
Pb-Free Reflow Profile (Note 6). . . . . . . . . . . . . . . . . . . . . . . . . . . see TB493
Recommended Operating Conditions
Temperature Range (Full Range Industrial) . . . . . . . . . . .-40°C to +125°C
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
IMPORTANT NOTE: All parameters having Min/Max specifications are guaranteed. Typ values are for information purposes only. Unless otherwise noted,
all tests are at the specified temperature and are pulsed tests, therefore: TJ = TC = TA
NOTES:
4. Measured with no filtering, distance of 10” from source, intensity set to 55kV and 70mA current, 30s duration. Other exposure levels should be
analyzed for Output Voltage drift effects. See “Applications Information” on page 16.
5. JA is measured with the component mounted on a high-effective thermal conductivity test board in free air. See tech brief TB379 for details.
6. Post-reflow drift for the ISL21007 devices will range from 100µV to 1.0mV based on experimental results with devices on FR4 double sided boards.
The design engineer must take this into account when considering the reference voltage after assembly.
Common Electrical Specifications (ISL21007-12, -20, -25, -30) TA = -40°C to +125°C, unless otherwise
specified. Boldface limits apply across the operating temperature range, -40°C to +125°C.
PARAMETER
SYMBOL
CONDITIONS
MIN
MAX
(Note 10) TYP (Note 10) UNIT
VOUT Accuracy at TA = +25°C
VOA
ISL21007B
ISL21007C
-0.5
+0.5
mV
-1.0
+1.0
mV
ISL21007D
-2.0
+2.0
mV
Output Voltage Temperature
Coefficient (Note 7)
TC VOUT
ISL21007B
ISL21007C
3 ppm/°C
5
ppm/°C
ISL21007D
10 ppm/°C
Supply Current
IIN
Trim Range
75 150
µA
±2.0 ±2.5
%
Turn-On Settling Time
Ripple Rejection
tR
VOUT = ±0.1%
f = 10kHz
120
µs
60
dB
Output Voltage Noise
Broadband Voltage Noise
Noise Density
eN
0.1Hz ≤ f ≤10Hz
VN
10Hz ≤ f ≤1kHz
f = 1kHz
4.5
µVP-P
2.2
µVRMS
60
nV/Hz
FN6326 Rev.12.00
Jun 9, 2017
Page 4 of 20
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