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74FCT163827APAG 데이터 시트보기 (PDF) - Integrated Device Technology

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74FCT163827APAG
IDT
Integrated Device Technology IDT
74FCT163827APAG Datasheet PDF : 7 Pages
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IDT74FCT163827A/C
3.3V CMOS 20-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
T EST CI RCU I T S AN D WAV EFORM S
6v
V CC
Open
VIN
Pulse
Generator
D.U.T.
RT
VOUT
50pF
CL
500Ω
500Ω
GND
SWITCH POSITION
Test
Open Drain
Disable Low
Enable Low
Disable High
Enable High
All Other Tests
Switch
6V
GND
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Test Circuits for All Outputs
DATA
INPUT
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
tSU
ETC.
tH
tREM
tH
Set-up, Hold, and Release Times
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
tPHL
OPPOSITE PHASE
INPUT TRANSITION
Propagation Delay
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
tW
HIGH-LOW-HIGH
PULSE
Pulse Width
1.5V
1.5V
3V
1.5V
0V
VOH
1.5V
VOL
3V
1.5V
0V
CONTROL
INPUT
OUTPUT
NORMALLY
LOW
OUTPUT
NORMALLY
HIGH
ENABLE
DISABLE
tPZL
SWITCH
6V
tPZH
tPLZ
3V
1.5V
tPHZ
SWITCH
GND
1.5V
0V
Enable and Disable Times
0.3V
0.3V
3V
1.5V
0V
3V
VOL
VOH
0V
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns.
3. if VCC is below 3V, input voltage swings should be adjusted not to exceed VCC.
6

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