ADR292FR 데이터 시트보기 (PDF) - Analog Devices

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ADR292FR

Low Noise Micropower Precision Voltage References

Analog Devices 

ADR290/ADR291/ADR292

WAFER TEST LIMITS (@ ILOAD = 0 mA, TA = ؉25؇C unless otherwise noted)

Parameter

Symbol

Conditions

Limits

Units

INITIAL ACCURACY

ADR290

ADR291

ADR292

LINE REGULATION

LOAD REGULATION

SUPPLY CURRENT

VO

VO

VO

∆VO/∆VIN

∆VO/ ∆ ILOAD

VO + 1 V < VIN < 15 V, IOUT = 0 mA

0 to 5 mA, VIN = VO + 1 V

ADR290, ADR291, No Load

ADR292, No Load

2.042/2.054

2.494/2.506

4.090/4.102

125

125

12

15

V

V

V

ppm/V

ppm/mA

µA

µA

NOTES

Electrical tests are performed as wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed

for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.

Specifications subject to change without notice.

DICE CHARACTERISTICS

Die Size 0.074 ؋ 0.052 inch, 3848 sq. mils

(1.88 ؋ 1.32 mm, 2.48 sq. mm)

Transistor Count: 52

1. VIN

2. GND

3. VOUT(FORCE)

4. VOUT(SENSE)

REV. A

For additional DICE ordering information, refer to databook.

–5–

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