M58LW032D 데이터 시트보기 (PDF) - STMicroelectronics
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M58LW032D Datasheet PDF : 50 Pages
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M58LW032D
Figure 11. Write AC Waveform, Write Enable Controlled
A0-A21
E2, E1, E0(1)
G
W
DQ0-DQ15
STS
(Ready/Busy mode)
VPEN
VALID
tAVWH
tWHAX
tELWL
tWHEH
tGHWL
tWLWH
tWHWL
tDVWH
INPUT
tWHDX
tVPHWH
tWHBL
tWHGL
AI06241
Note: 1. VIH = Device Disabled (first edge of E0, E1 or E2), VIL = Device Enabled (first edge of E0, E1 or E2). Refer to Table 2. for more
details.
Table 17. Write AC Characteristics, Write Enable Controlled
Symbol
Parameter
Test Condition
M58LW032D
Unit
90 - 110
tAVWH Address Valid to Write Enable High
E = VIL
Min
50
ns
tDVWH Data Input Valid to Write Enable High
E = VIL
Min
50
ns
tELWL Chip Enable Low to Write Enable Low
Min
0
ns
tVPHWH Program/Erase Enable High to Write Enable High
Min
0
ns
tWHAX Write Enable High to Address Transition
E = VIL
Min
0
ns
tWHBL Write Enable High to Status/(Ready/Busy) low
Max
500
ns
tWHDX Write Enable High to Input Transition
E = VIL
Min
0
ns
tWHEH Write Enable High to Chip Enable High
Min
0
ns
tGHWL Output Enable High to Write Enable Low
Min
20
ns
tWHGL Write Enable High to Output Enable Low
Min
35
ns
tWHWL Write Enable High to Write Enable Low
Min
30
ns
tWLWH Write Enable Low to Write Enable High
E = VIL
Min
70
ns
28/50
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