M58LW032D 데이터 시트보기 (PDF) - STMicroelectronics
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M58LW032D Datasheet PDF : 50 Pages
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Figure 12. Write AC Waveforms, Chip Enable Controlled
M58LW032D
A0-A21
W
G
E2, E1, E0(1)
tWLEL
tGHEL
DQ0-DQ15
STS
(Ready/Busy mode)
VPEN
VALID
tAVEH
tEHAX
tEHWH
tELEH
tEHEL
tDVEH
INPUT
tEHDX
tVPHEH
tEHBL
tEHGL
AI06242
Note: 1. VIH = Device Disabled (first edge of E0, E1 or E2), VIL = Device Enabled (first edge of E0, E1 or E2). Refer to Table 2. for more
details.
Table 18. Write AC Characteristics, Chip Enable Controlled.
Symbol
Parameter
Test Condition
M58LW032D
90 - 110
Unit
tAVEH Address Valid to Chip Enable High
W = VIL
Min
50
ns
tDVEH Data Input Valid to Chip Enable High
W = VIL
Min
50
ns
tWLEL Write Enable Low to Chip Enable Low
Min
0
ns
tVPHEH Program/Erase Enable High to Chip Enable High
Min
0
ns
tEHAX Chip Enable High to Address Transition
W = VIL
Min
0
ns
tEHBL Chip Enable High to Status/(Ready/Busy) low
Max
500
ns
tEHDX Chip Enable High to Input Transition
W = VIL
Min
0
ns
tEHWH Chip Enable High to Write Enable High
Min
0
ns
tGHEL Output Enable High to Chip Enable Low
Min
20
ns
tEHGL Chip Enable High to Output Enable Low
Min
35
ns
tEHEL Chip Enable High to Chip Enable Low
Min
30
ns
tELEH Chip Enable Low to Chip Enable High
W = VIL
Min
70
ns
29/50
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