CXD1175AP 데이터 시트보기 (PDF) - Sony Semiconductor

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CXD1175AP

8-bit 20MSPS Video A/D Converter (CMOS)

Sony Semiconductor 

CXD1175AM/AP

Electrical Characteristics Measurement Circuit

} Integral non-linearity error

Differential non-linearity error measurement circuit

Offset voltage

+V

S2

S1: ON IF A < B

S2: ON IF B > A

S1

VIN

DVM

–V

A<B A>B

DUT

8

CXD1175A

COMPARATOR

A8

B8

8

to

to

A1

B1

A0

B0

"0"

"1"

CLK (20MHz)

CONTROLLER

BUFFER

8

000 · · · 00

to

111 · · · 10

3-state output measurement circuit

Measurement

point

DVDD

RL

To output pin

CL

RL

Note) CL includes the capacitance of the probe

and others.

} Maximum operational speed

Differential gain error

measurement circuit

Differential phase error

2.5V

S.G.

NTSC

SIGNAL

SOURCE

Fc – 1kHz

1

AMP

2

100

40 IRE

MODULATION

BURST

0

–40

SYNC

0.5V

VIN CXD

1175A

2.5V

0.5V

S.G.

(CW) FC

8

TTL

ECL

TTL

ECL

CX20202A-1

1

8

10bit

D/A

620

2

–5.2V

CLK

620

–5.2V

ERROR RATE

H.P.F

COUNTER

VECTOR

SCOPE

D.G

D.P.

Digital output current measurement circuit

2.5V

0.5V

VDD

VRT

VIN

VRB

CLK

OE

GND

IOL

VOL +

–

2.5V

0.5V

VDD

VRT

VIN

VRB

CLK

OE

GND

IOH

VOH +

–

–7–

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