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10N80K5(2014) 데이터 시트보기 (PDF) - STMicroelectronics

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10N80K5 Datasheet PDF : 14 Pages
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STF10N80K5
4
Test circuits
Test circuits
Figure 15. Switching times test circuit for
resistive load
VD
VGS
RG
PW
RL
2200
μF
D.U.T.
3.3
μF VDD
AM01468v1
Figure 16. Gate charge test circuit
VDD
12V
47kΩ
1kΩ
100nF
Vi=20V=VGMAX
2200
μF
IG=CONST
2.7kΩ
100Ω
D.U.T.
VG
47kΩ
PW
1kΩ
AM01469v1
Figure 17. Test circuit for inductive load
switching and diode recovery times
Figure 18. Unclamped inductive load test circuit
A
AA
D
FAST
G
D.U.T.
DIODE
L=100μH
VD
S
B
3.3
1000
B
25 Ω
B
D
μF
μF
VDD
ID
G
RG
S
Vi
Pw
AM01470v1
L
2200
3.3
μF
μF
VDD
D.U.T.
AM01471v1
DocID026564 Rev 4
9/14
14

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