AT89C51RC2(2002) 데이터 시트보기 (PDF) - Atmel Corporation

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AT89C51RC2
(Rev.:2002)

FLASH C51 Microcontrollers

Atmel Corporation 

AT89C51RB2 / RC2 & T89C51IC2 QualPack

Conclusions:

- Vt_wrt shift of 200mV after 10k cycles

- I_read decrease of 2.5uA after 10kcycles (- 7 to 9 %)

- No big difference between bit0 and bit 7 in terms of Vt or current variations Using the coefficients

4.3.4.2 Cell retention

Purpose:

To extrapolate cell life duration at 125°c from bake measurements at high temperature.

Test parameters:

Lot:

9T0930

Temperature: 250°c and 200°c

Duration:

92 hours

Lifetime Prediction:

The equation used to describe memory cell retention is:

DVt (V) = A * (t[h])^m * exp (-1.05eV/kT[K])

Results :

56.8k cell - 9t0930 (#24/25)

0

-1 1

-2

-3

-4

-5

10

100

y = 0,2138Ln(x) - 2,3118

y = 0,2211Ln(x) - 4,8026

200C

250C

Bake time (h)

Test measurements

290,0

270,0

250,0

230,0

210,0

190,0

170,0

150,0

1

10

100 1000 10000 100000

time (h)

Extrapolated Life Time

Conclusions :

Extrapolation to 125C - 10years = Vt loss is less than 0.8mV

Rev. 1 – 2002 June

15

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