AT89C51RC2(2002) 데이터 시트보기 (PDF) - Atmel Corporation

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AT89C51RC2
(Rev.:2002)

FLASH C51 Microcontrollers

Atmel Corporation 

AT89C51RB2 / RC2 & T89C51IC2 QualPack

4.3.4.4 Wafer probe Data retention measurement

Data retention has been verified after bake for 168 hours at 250°C on 3 wafers of a standard production lot. The

results are summarized in the table below:

Lot

1G4448

1G4448

1G4448

Total

Wafer

6

8

12

% Retention loss

0%

0%

0%

0%

Failure rate

extrapolation at 55°C

3.91fit

4.19fit

3..96fit

1.34fit

Time to failure

>> 10 years

>> 10 years

>> 10 years

>> 10 years

Conclusion:

Data Retention measurements at wafer probe stand out high data retention capability of AT56800 products,

exceeding the technology requirement of ten years.

Rev. 1 – 2002 June

17

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