LH28F800SU 데이터 시트보기 (PDF) - Sharp Electronics

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LH28F800SU

8M (512K × 16, 1M × 8) Flash Memory

Sharp Electronics 

LH28F800SU

8M (512K × 16, 1M × 8) Flash Memory

Capacitance

For 3.3 V Systems

SYMBOL

PARAMETER

TYP. MAX. UNITS

TEST CONDITIONS

NOTE

CIN

Capacitance Looking into an

Address/Control Pin

6

8

pF TA = 25°C, f = 1.0 MHz

1

COUT Capacitance Looking into an Output Pin

8

12

pF TA = 25°C, f = 1.0 MHz

1

CLOAD

Load Capacitance Driven by Outputs for

Timing Specifications

50

pF For VCC = 3.3 V ±0.3 V

1

Equivalent Testing Load Circuit

2.5

ns 50 Ω transmission line delay

Capacitance

For 5.0 V Systems

SYMBOL

PARAMETER

TYP. MAX. UNITS

TEST CONDITIONS

NOTE

CIN

Capacitance Looking into an

Address/Control Pin

6

8

pF TA = 25°C, f = 1.0 MHz

1

COUT Capacitance Looking into an Output Pin

8

12

pF TA = 25°C, f = 1.0 MHz

1

CLOAD

Load Capacitance Driven by Outputs for

Timing Specifications

100

pF For VCC = 5.0 V ±05 V

1

Equivalent Testing Load Circuit VCC ± 10%

Equivalent Testing Load Circuit VCC ± 5%

NOTE:

1. Sampled, not 100% tested.

2.5

ns 25 Ω transmission line delay

2.5

ns 83 Ω transmission line delay

16

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