LH28F800SU 데이터 시트보기 (PDF) - Sharp Electronics

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LH28F800SU

8M (512K × 16, 1M × 8) Flash Memory

Sharp Electronics 

LH28F800SU

8M (512K × 16, 1M × 8) Flash Memory

2.4

2.0

INPUT

TEST POINTS

0.45

0.8

2.0

OUTPUT

0.8

NOTE:

AC test inputs are driven at VOH (2.4 VTTL) for a Logic '1' and VOL

(0.45 VTTL) for a Logic '0'. Input timing begins at VIH (2.0 VTTL)

and VIL (0.8 VTTL). Output timing ends at VIH and VIL. Input rise

and fall times (10% to 90%) < 10 ns.

28F800SUR-6

Figure 7. Transient Input/Output

Reference Waveform (VCC = 5.0 V)

2.5 ns OF 50 Ω TRANSMISSION LINE

FROM OUTPUT

UNDER TEST

TEST

POINT

TOTAL CAPACITANCE = 50 pF

28F800SUR-8

Figure 9. Transient Equivalent Testing

Load Circuit (VCC = 3.3 V)

3.0

INPUT 1.5

0.0

TEST POINTS

1.5 OUTPUT

NOTE:

AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a

Logic '0'. Input timing begins and output timing ends at 1.5 V.

Input rise and fall times (10% to 90%) < 10 ns.

28F800SUR-7

Figure 8. Transient Input/Output

Reference Waveform (VCC = 3.3 V)

2.5 ns OF 25 Ω TRANSMISSION LINE

FROM OUTPUT

UNDER TEST

TEST

POINT

TOTAL CAPACITANCE = 100 pF

28F800SUR-9

Figure 10. Transient Equivalent Testing

Load Circuit (VCC = 5.0 V)

2.5 ns OF 83W TRANSMISSION LINE

FROM OUTPUT

UNDER TEST

TEST

POINT

TOTAL CAPACITANCE = 30 pF

28F800SUR-18

Figure 11. High Speed Transient Equivalent

Testing Load Circuit (VCC = 5.0 V ± 5%)

18

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